particle-induced X-ray emission
Quick Summary
Particle-induced X-ray emission (PIXE) is an analytical method used to study surfaces. In PIXE, a sample's surface is bombarded with accelerated particles, such as protons. This bombardment causes the emission of characteristic X-rays from the sample. By monitoring these emitted X-rays, scientists can determine the elemental composition of the surface. If protons are used as the bombarding particles and the technique maps the elemental distribution on a surface, it is called a proton microprobe. This method is valuable in fields like mineralogy and metallurgy.12
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