atomic force microscopy
Quick Summary
Atomic force microscopy (AFM) is an instrument used to map the atomic-scale topography of a surface. It works by dragging an atomically sharp stylus across the surface and measuring the force between the stylus and the surface. This force measurement is then translated into a description of the surface topography, creating a three-dimensional image. Unlike some other microscopy techniques, AFM does not require a vacuum and can operate in air or even underwater. It is a valuable tool for surface analysis, complementing other techniques by providing topographical information.12
Ask Britannica AI about this topic
Britannica doesn't have a full article on this topic, so we've curated a list of our relevant coverage.
