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How can electron beams damage organic materials during Auger electron spectroscopy?
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surface analysis
A scanning-electron-microscope photograph of pyroxene and plagioclase crystals (the long and the short crystals, respectively) that grew in a cavity in a fragment of Moon rock gathered during the Apollo 14 mission.
In Auger electron spectroscopy (AES), the use of a high-intensity electron beam as a probe can cause significant damage to organic materials. Because electrons are more destructive than photons, they can induce several detrimental effects during analysis:1
- Chemical Damage: The primary effect of the electron beam on organic samples is chemical alteration, which can lead to incorrect analytical results if the beam reduces species on the surface rather than measuring the original state.1
- Sputtering and Desorption: The bombardment of the surface by the electron beam can cause the sputtering of material and the desorption of adsorbed species.1
- Migration: Species may migrate to or from the surface under the influence of the electron beam, further compromising the integrity of the sample.1
To maintain the accuracy of surface analysis, it is ethically and scientifically imperative to minimize such damage by keeping the current density low and the sampling time as short as possible.1