David C. Joy
Contributor
Distinguished Professor of Zoology, University of Tennessee, Knoxville. Distinguished Scientist, Oak Ridge National Laboratory, Tennessee; Director, Electron Microscopy Facility. Coeditor of Principles of Analytical Electron Microscopy.
Primary Contributions (6)
Scanning electron microscope (SEM), type of electron microscope, designed for directly studying the surfaces of solid objects, that utilizes a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. The electron source and…
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